JPS6184528A - 温度測定装置 - Google Patents
温度測定装置Info
- Publication number
- JPS6184528A JPS6184528A JP59206731A JP20673184A JPS6184528A JP S6184528 A JPS6184528 A JP S6184528A JP 59206731 A JP59206731 A JP 59206731A JP 20673184 A JP20673184 A JP 20673184A JP S6184528 A JPS6184528 A JP S6184528A
- Authority
- JP
- Japan
- Prior art keywords
- radiant energy
- measuring body
- scanning
- thermometer
- radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0896—Optical arrangements using a light source, e.g. for illuminating a surface
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/48—Thermography; Techniques using wholly visual means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/80—Calibration
- G01J5/802—Calibration by correcting for emissivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J2005/0074—Radiation pyrometry, e.g. infrared or optical thermometry having separate detection of emissivity
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Radiation Pyrometers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59206731A JPS6184528A (ja) | 1984-10-02 | 1984-10-02 | 温度測定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59206731A JPS6184528A (ja) | 1984-10-02 | 1984-10-02 | 温度測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6184528A true JPS6184528A (ja) | 1986-04-30 |
JPH0548405B2 JPH0548405B2 (en]) | 1993-07-21 |
Family
ID=16528170
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59206731A Granted JPS6184528A (ja) | 1984-10-02 | 1984-10-02 | 温度測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6184528A (en]) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6375526A (ja) * | 1986-09-18 | 1988-04-05 | Chino Corp | 温度測定装置 |
JPS6375525A (ja) * | 1986-09-18 | 1988-04-05 | Chino Corp | 温度測定装置 |
US6953281B2 (en) * | 2001-04-21 | 2005-10-11 | Robert Bosch Gmbh | Method for determining temperatures on semiconductor components |
-
1984
- 1984-10-02 JP JP59206731A patent/JPS6184528A/ja active Granted
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6375526A (ja) * | 1986-09-18 | 1988-04-05 | Chino Corp | 温度測定装置 |
JPS6375525A (ja) * | 1986-09-18 | 1988-04-05 | Chino Corp | 温度測定装置 |
US6953281B2 (en) * | 2001-04-21 | 2005-10-11 | Robert Bosch Gmbh | Method for determining temperatures on semiconductor components |
Also Published As
Publication number | Publication date |
---|---|
JPH0548405B2 (en]) | 1993-07-21 |
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