JPS6184528A - 温度測定装置 - Google Patents

温度測定装置

Info

Publication number
JPS6184528A
JPS6184528A JP59206731A JP20673184A JPS6184528A JP S6184528 A JPS6184528 A JP S6184528A JP 59206731 A JP59206731 A JP 59206731A JP 20673184 A JP20673184 A JP 20673184A JP S6184528 A JPS6184528 A JP S6184528A
Authority
JP
Japan
Prior art keywords
radiant energy
measuring body
scanning
thermometer
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59206731A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0548405B2 (en]
Inventor
Isao Hishikari
功 菱刈
Tetsuo Kobari
小針 哲郎
Mitsuo Ishige
石毛 光雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chino Corp
Original Assignee
Chino Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chino Works Ltd filed Critical Chino Works Ltd
Priority to JP59206731A priority Critical patent/JPS6184528A/ja
Publication of JPS6184528A publication Critical patent/JPS6184528A/ja
Publication of JPH0548405B2 publication Critical patent/JPH0548405B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0896Optical arrangements using a light source, e.g. for illuminating a surface
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/48Thermography; Techniques using wholly visual means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/80Calibration
    • G01J5/802Calibration by correcting for emissivity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J2005/0074Radiation pyrometry, e.g. infrared or optical thermometry having separate detection of emissivity

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)
JP59206731A 1984-10-02 1984-10-02 温度測定装置 Granted JPS6184528A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59206731A JPS6184528A (ja) 1984-10-02 1984-10-02 温度測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59206731A JPS6184528A (ja) 1984-10-02 1984-10-02 温度測定装置

Publications (2)

Publication Number Publication Date
JPS6184528A true JPS6184528A (ja) 1986-04-30
JPH0548405B2 JPH0548405B2 (en]) 1993-07-21

Family

ID=16528170

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59206731A Granted JPS6184528A (ja) 1984-10-02 1984-10-02 温度測定装置

Country Status (1)

Country Link
JP (1) JPS6184528A (en])

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6375526A (ja) * 1986-09-18 1988-04-05 Chino Corp 温度測定装置
JPS6375525A (ja) * 1986-09-18 1988-04-05 Chino Corp 温度測定装置
US6953281B2 (en) * 2001-04-21 2005-10-11 Robert Bosch Gmbh Method for determining temperatures on semiconductor components

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6375526A (ja) * 1986-09-18 1988-04-05 Chino Corp 温度測定装置
JPS6375525A (ja) * 1986-09-18 1988-04-05 Chino Corp 温度測定装置
US6953281B2 (en) * 2001-04-21 2005-10-11 Robert Bosch Gmbh Method for determining temperatures on semiconductor components

Also Published As

Publication number Publication date
JPH0548405B2 (en]) 1993-07-21

Similar Documents

Publication Publication Date Title
US4172383A (en) Method and an apparatus for simultaneous measurement of both temperature and emissivity of a heated material
US5208643A (en) Method of and apparatus for non-contact temperature measurement
GB1401778A (en) Method for measuring the surface temperature of a metal object
JP6127019B2 (ja) 半透明材料の熱拡散率の測定方法
US4989970A (en) Non-contact sensing apparatus and method for temperature profile and thickness determination and control of radiation translucent materials
JPS6184528A (ja) 温度測定装置
JPS636428A (ja) 物体の表面温度測定方法
JPS634651B2 (en])
JPH0521412B2 (en])
JPS5940250B2 (ja) 温度と放射率の同時測定方法
JPH0514852B2 (en])
CN207231634U (zh) 一种光谱测量装置
JP2556556B2 (ja) 金属表面の粗度測定方法
JPH05507356A (ja) 物体の温度測定方法及び装置並びに加熱方法
JPH0676922B2 (ja) 放射温度測定装置
JPH087169B2 (ja) 熱膨張係数測定方法と装置
JPS6225973B2 (en])
JPH0511252B2 (en])
JPS6219947Y2 (en])
JPH0413910A (ja) 酸化膜厚さ分布測定装置
JPH08122155A (ja) 物体表面温度の放射測温法
SU453564A1 (ru) Способ измерения толщины слоя полупрозрачного материала
JP3291781B2 (ja) 鋼板の温度測定方法及び装置
JPH06147995A (ja) 赤外線検出装置
JPS59111026A (ja) 鋼板の温度測定方法